| EELS, sample thickness | Approximately 20 nm |
|---|---|
| HAADF-STEM viewing direction | [100]pc zone axis |
| HAADF-STEM, Nb displacement direction | Clustered approximately in the [011]pc direction |
| HAADF-STEM, average Nb displacement | 20 pm |
| HAADF-STEM, Nb displacement standard deviation | 5 pm |
| 4D-STEM viewing direction | [100]pc zone axis |
| iDPC-STEM viewing direction | [100]pc zone axis |
| iDPC-STEM, localized intensity drops | One oxygen column and two adjacent A-site columns |
| iDPC-STEM, suggested clustered defect | Neutral oxygen-vacancy–A-site-vacancy complex (e.g., VO∙∙−2VK/Na′) |
| iDPC-STEM, Nb displacement direction | Predominantly along the [001]pc direction |
| iDPC-STEM, average Nb displacement | 24 ± 6 pm |
| Electron microscopy operating voltage | 200 kV |
Janina Roknić, Katarina Žiberna, Maja Koblar, Matic Poberžnik, Anton Kokalj, Goran Dražić, Andreja Benčan Golob. “Point-defect-enhanced local polarization in (K0.5Na0.5)NbO3 revealed by atomic-scale microscopy and simulations.” ChemRxiv (). https://doi.org/10.26434/chemrxiv.15007489/v1
Simulation results were not retained