Arthur Fordham, Thomas Dore, Yuhan Liu, Liam Bird, Pranay Gandharapu, Alice Llewellyn, Robert Scott Young, P. M. Anuradha Bandaranayake, Ashok S Menon, Eleni Fiamegkou, Stefan Michalik, Genoveva Burca, Alexander J. E. Rettie, Paul R. Shearing, Thomas Miller, James B. Robinson, Louis Piper, Rhodri Jervis. “The influence of formation protocol on heterogeneous degradation of lithium-ion pouch cells revealed by spatially resolved synchrotron X-ray diffraction.” ChemRxiv (). https://doi.org/10.26434/chemrxiv.15007496/v1

C/20 cell, post-formation
sXRD maps, graphite (002), NMC811 (101), and NMC811 (003) Spatially uniform at all measured voltages, with no distinct domains or sharp gradients
NMC811 (003) Expanded up to approximately 4.0 V, then contracted at higher voltages
NMC811 (101) Evolved more weakly and plateaued at higher voltages
Graphite (002) at 2.5 V Mild spatial gradient before charging; disappeared on charging
Graphite (002) at 4.0 and 4.3 V Uniform shift to positive values
Discharge return Reflections returned close to their initial positions; small residual positive offset near the electrode edges in graphite (002)
Inactivity-map Dice coefficient at the 0.85 threshold 0.00
Main, pp. 9–10, 16, 18–20; SI, pp. 2, 18
1C cell, post-formation
Spatial lattice response Heterogeneous, with circular inactive areas especially at the bottom and right, farthest from the tabs
Graphite (002), 3.35–3.55 Å Voltage-dependent splitting and asymmetry, with a second peak at intermediate and high states of charge
NMC811 (003), 4.7–4.9 Å Simultaneous broadening and nonlinear shifts with voltage
NMC811 (101), dark-blue spots at 2.5 V Likely artefacts from local peak-fitting instabilities or detector effects
Inactivity-map Dice coefficient at the 0.85 threshold 0.37
Main, pp. 10, 14, 17–20; SI, pp. 2, 18
C/20 cell after 250 cycles
sXRD response Largely homogeneous
Graphite (002) Small inactive region near the lower-left edge of the tabs
Peak definition and reversibility Peaks remained well defined and largely reversible; voltage-induced shifts remained parallel across state of charge
NMC811 (003) Comparatively sharp and symmetric
Spatially averaged XRD Systematic but reduced peak shifts compared with post-formation data, with slight peak broadening
Inactivity-map Dice coefficient at the 0.85 threshold 0.83
Main, pp. 22–24; SI, pp. 12, 18, 20
1C cell after 250 cycles
sXRD response More severe heterogeneity than in both post-formation maps
Graphite (002) map Large portion showed no lattice-parameter change on charging
Spatial correspondence Graphite heterogeneity at 4.0 V was reflected in a similar NMC pattern at 4.3 V
Graphite (002) Higher d-spacing than post-formation at equivalent voltages, with reduced intensity and increased broadening
NMC811 (003) Increased asymmetry and broadening, reduced c-axis contraction, and higher d-spacing at 4.3 V than post-formation
Peak splitting Small degree in some regions, but not widespread
Operando point diffraction Pronounced broadening, dispersion, and hysteresis; graphite reflections less well resolved
Inactivity-map Dice coefficient at the 0.85 threshold 0.52
Main, pp. 23–25, 28; SI, pp. 13, 18, 20
C/10 cell, post-formation
Mapped response Homogeneous across most of the mapped region
Inactive region during charge Roughly 15 % of the electrode surface
sXRD left-tab-region assignment Attributed to a manufacturing or compression defect
sXRD anomalous-contrast assignment Attributed to a beam or detector artefact, such as transient beam instability or non-planarity of the electrode surface
Operando point diffraction Clear and reversible lattice evolution in NMC811 and graphite
Main, pp. 20, 26–28; SI, pp. 2, 18, 21
Voltage-hold cell, post-formation
sXRD maps Spatially consistent and homogeneous, with uniform lithiation and little spatial variation in lattice parameters
Mapped voltages during charge 2.5, 4.0, and 4.3 V
Operando point diffraction Clear and reversible lattice evolution in NMC811 and graphite
Inactivity-map Dice coefficient at the 0.85 threshold 0.85