Yujin Park, Tanner A. Wilcoxson, Yina Wu, Jordan A. Hachtel, Tanay Paul, Hans A. Bechtel, Stephanie N. Gilbert Corder, M. Wren Berry, Lauralee E. Hurst, Woo Je Chang, Saghar Rezaie, Sadegh Yazdi, F. Javier García de Abajo, Thomas M. Truskett, Delia J. Milliron. “Collective plasmon resonances in hierarchically doped metal oxide nanocrystal metasurfaces.” ChemRxiv (). https://doi.org/10.26434/chemrxiv.15007539/v1

0 % Sn-ITO nanocrystals
SAXS-fit diameter 25.6 ± 1.9 nm
Polydispersity 7.3 %
SI, p. 3
1 % Sn-ITO nanocrystals
SAXS-fit diameter 24.9 ± 2.0 nm
Polydispersity 8.2 %
SI, p. 3
2 % Sn-ITO nanocrystals
SAXS-fit diameter 24.5 ± 2.2 nm
Polydispersity 9.0 %
SI, p. 3
3 % Sn-ITO nanocrystals
SAXS-fit diameter 25.6 ± 1.9 nm
Polydispersity 7.4 %
SI, p. 3
ITO nanocrystal monolayer
Average local bond-orientational order, Ψ6 0.78
SI, p. 4
Oleate-capped 1 % ITO nanocrystal monolayer
Average wave vector, qy,avg 0.0267 Å⁻¹
Nanocrystal diameter used for GISAXS 24.7 ± 2.1 nm
Neighboring-nanocrystal gap spacing estimated from GISAXS 2.5 nm
Main, p. 8; SI, p. 5
Actual Sn content measured by ICP-MS
Nominal 0 % Sn-ITO 0.03 at%
Nominal 1 % Sn-ITO 0.74 at%
Nominal 3 % Sn-ITO 2.45 at%
SI, p. 6
3 % ITO nanocrystals in binary monolayers
Experimental in-plane far-field peak as φ1% decreased from 1.0 Emerges near 4000 cm⁻¹
Main, p. 12
3 % ITO nanocrystal monolayer EELS components
Lowest-energy experimental NMF component peak 0.49 eV
Intermediate-energy experimental NMF component peak 0.65 eV
Highest-energy experimental NMF component peak 0.90 eV
SI, p. 22
Single-component 3 % ITO nanocrystal monolayer STEM-EELS
STEM-EELS/NMF nanocrystal count n = 1103
Measured peak 0.62 eV
Measured peak 0.78 eV
Measured peak 0.94 eV
0.94 eV peak at the gap Vanishes
0.78 eV peak Persists at the gap but diminishes at the nanocrystal center
Highest-energy peak-position variation across individual nanocrystals ≈4 %
Lowest-energy peak-position variation across individual nanocrystals ≈1 %
Lowest-energy experimental NMF component peak Approximately 0.55 eV
Intermediate-energy experimental NMF component peak Approximately 0.78 eV
Highest-energy experimental NMF component peak Approximately 0.94 eV
Highest-energy NMF map used to assign 3 % ITO nanocrystals 0.94–0.99 eV
Main, pp. 17–20; SI, p. 30
Binary ITO nanocrystal monolayer STEM-EELS
STEM-EELS/NMF nanocrystal count, φ1% = 0.1 n = 1238
STEM-EELS/NMF nanocrystal count, φ1% = 0.5 n = 1085
Experimental EELS feature, φ1% = 0.5 0.45 eV
Experimental EELS feature, φ1% = 0.9 0.50 eV
Higher-energy experimental EELS pattern, φ1% = 0.0 to 0.9 Redshifts from 0.78 to 0.63 eV
Lower-energy experimental EELS pattern, φ1% = 0.0 to 0.9 Blueshifts from 0.55 to 0.63 eV
Higher-energy experimental EELS feature, φ1% = 0.9 0.63 eV
Lower-energy experimental EELS feature, φ1% = 0.9 0.50 eV
φ1% = 0.1 0.47 eV
Higher-energy experimental EELS feature, φ1% = 0.5 0.66 eV
Lower-energy experimental EELS feature, φ1% = 0.5 0.45 eV
Main, pp. 21–22; SI, p. 31
Nominal and actual φ1% from STEM-EELS/NMF analysis
Nominal 0.0 Actual 0.0
Nominal 0.1 Actual 0.16
Nominal 0.5 Actual 0.52
Nominal 0.9 Actual 0.88
Nominal 1.0 Actual 1.0
Nanocrystals per HAADF/NMF image used to estimate actual φ1% Approximately 150
3 % ITO assignment Highest-energy experimental NMF map at 0.94–0.99 eV; unmatched aggregated nanocrystals were classified as non-3 %
Experimental-position RDF ratio Approaches unity across all length scales, supporting random mixing